DocumentCode :
2259985
Title :
Nonlinear finite element simulation of thermoviscoplastic deformation of C4 solder joints in high density packaging under thermal cycling
Author :
Hong, Bor Zen ; Burrell, Lloyd G.
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear :
1994
fDate :
4-7 May 1994
Firstpage :
117
Lastpage :
125
Abstract :
A nonlinear finite element model has been used to simulate the thermally induced viscoplastic deformation of the controlled collapse chip connection (C4) solder joints in a high density single chip module (SCM). The dependence of solder joint deformation on the tin content was demonstrated for various lead-rich Pb-Sn alloys with the tin content varying from 2 wt% to 10 wt%. A thermoviscoplasticity theory was introduced for modeling inelastic stress-strain response of the Pb-Sn alloys. In the theory, the creep and plasticity were separately considered and formulated. The Garafalo hyperbolic sine law was used to model the creep behavior, while the Prandtl-Reuss equation was used for the rate independent plastic deformation. The modeled SCM consists of a 5 mm silicon chip attached to 50 mm alumina substrate by an array of C4 with diameter of O.1 mm on a 0.2 mm I/O pitch. A cyclic temperature load of 0 to 100°C at frequency of 3 cycles per hour was applied to the SCM, and a nonlinear finite element program ABAQUS was used to numerically study the effect of the tin content on the stress-strain response of the C4. It is concluded that the decrease of the tin content induces a decrease of the equivalent creep strain and Mises stress, but an increase of the equivalent plastic strain for the edge C4 in the SCM
Keywords :
creep; finite element analysis; modelling; packaging; plastic deformation; simulation; soldering; stress analysis; stress-strain relations; 0 to 100 C; ABAQUS; Al2O3; C4 solder joints; FEM; Garafalo hyperbolic sine law; Mises stress; Pb-Sn; Pb-rich Pb-Sn alloys; Prandtl-Reuss equation; Si; Sn content; alumina substrate; controlled collapse chip connection; creep; equivalent creep strain; equivalent plastic strain; high density packaging; nonlinear finite element simulation; plasticity; single chip module; solder joint deformation; stress-strain response; thermal cycling; thermoviscoplastic deformation; thermoviscoplasticity theory; Capacitive sensors; Creep; Deformable models; Equations; Finite element methods; Lead; Plastics; Silicon; Soldering; Tin alloys;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1994. I-THERM IV. Concurrent Engineering and Thermal Phenomena., InterSociety Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1372-0
Type :
conf
DOI :
10.1109/ITHERM.1994.342907
Filename :
342907
Link To Document :
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