DocumentCode :
2260042
Title :
Predicting thermal contact resistance in circuit card assemblies
Author :
Kunkel, Scott H. ; Peck, Wiley M.
Author_Institution :
Melpar Div., E-Systems, Falls Church, VA, USA
fYear :
1994
fDate :
4-7 May 1994
Firstpage :
91
Lastpage :
100
Abstract :
On a typical conduction-cooled Circuit Card Assembly (CCA) there is a temperature rise caused by the resistance between component die, Printed Circuit Board (PCB), thermal frame (heat sink), and chassis. While the resistance at the component junction, through the PCB, and through the thermal frame can be readily calculated from material properties, modeling the thermal frame and card clamp to chassis interface can be difficult. For CCA power below approximately 25 watts the loss at the interface is usually less than 4°C (0.30°C/W for bare aluminum). As the thermal dissipation on a CCA reaches 50-75 watts (>1 watt/in2 on VME 1101.2 format), it becomes necessary to model this interface because of its increasing influence on the overall temperature rise. A method utilizing several Unigraphics GRLP routines, SINDA thermal analysis software, and empirical data has been developed that predicts the thermal interface performance between both the chassis and thermal frame, and the chassis and card clamp to within 30 percent of measured values
Keywords :
circuit analysis computing; computer aided analysis; cooling; modelling; packaging; printed circuit design; thermal analysis; thermal resistance; PCB; SINDA thermal analysis software; Unigraphics GRLP routines; card clamp to chassis interface; chassis; circuit card assemblies; conduction-cooled assembly; heat sink; modeling; printed circuit board; temperature rise; thermal contact resistance; thermal dissipation; thermal frame; thermal interface performance; Assembly; Clamps; Contact resistance; Heat sinks; Material properties; Printed circuits; Resistance heating; Temperature; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1994. I-THERM IV. Concurrent Engineering and Thermal Phenomena., InterSociety Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1372-0
Type :
conf
DOI :
10.1109/ITHERM.1994.342910
Filename :
342910
Link To Document :
بازگشت