• DocumentCode
    2260042
  • Title

    Predicting thermal contact resistance in circuit card assemblies

  • Author

    Kunkel, Scott H. ; Peck, Wiley M.

  • Author_Institution
    Melpar Div., E-Systems, Falls Church, VA, USA
  • fYear
    1994
  • fDate
    4-7 May 1994
  • Firstpage
    91
  • Lastpage
    100
  • Abstract
    On a typical conduction-cooled Circuit Card Assembly (CCA) there is a temperature rise caused by the resistance between component die, Printed Circuit Board (PCB), thermal frame (heat sink), and chassis. While the resistance at the component junction, through the PCB, and through the thermal frame can be readily calculated from material properties, modeling the thermal frame and card clamp to chassis interface can be difficult. For CCA power below approximately 25 watts the loss at the interface is usually less than 4°C (0.30°C/W for bare aluminum). As the thermal dissipation on a CCA reaches 50-75 watts (>1 watt/in2 on VME 1101.2 format), it becomes necessary to model this interface because of its increasing influence on the overall temperature rise. A method utilizing several Unigraphics GRLP routines, SINDA thermal analysis software, and empirical data has been developed that predicts the thermal interface performance between both the chassis and thermal frame, and the chassis and card clamp to within 30 percent of measured values
  • Keywords
    circuit analysis computing; computer aided analysis; cooling; modelling; packaging; printed circuit design; thermal analysis; thermal resistance; PCB; SINDA thermal analysis software; Unigraphics GRLP routines; card clamp to chassis interface; chassis; circuit card assemblies; conduction-cooled assembly; heat sink; modeling; printed circuit board; temperature rise; thermal contact resistance; thermal dissipation; thermal frame; thermal interface performance; Assembly; Clamps; Contact resistance; Heat sinks; Material properties; Printed circuits; Resistance heating; Temperature; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Phenomena in Electronic Systems, 1994. I-THERM IV. Concurrent Engineering and Thermal Phenomena., InterSociety Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-1372-0
  • Type

    conf

  • DOI
    10.1109/ITHERM.1994.342910
  • Filename
    342910