DocumentCode :
2260096
Title :
An efficient distributed memory interface for many-core platform with 3D stacked DRAM
Author :
Loi, Igor ; Benini, Luca
Author_Institution :
DEIS, Univ. of Bologna, Bologna, Italy
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
99
Lastpage :
104
Abstract :
Historically, processor performance has increased at a much faster rate than that of main memory and up-coming NoC-based many-core architectures are further tightening the memory bottleneck. 3D integration based on TSV technology may provide a solution, as it enables stacking of multiple memory layers, with orders-of-magnitude increase in memory interface bandwidth, speed and energy efficiency. To fully exploit this potential, the architectural interface to vertically stacked memory must be streamlined. In this paper we present an efficient and flexible distributed memory interface for 3D-stacked DRAM. Our interface ensures ultra-low-latency access to the memory modules on top of each processing element (vertically local memory neighborhoods). Communication to these local modules do not travel through the NoC and takes full advantage of the lower latency of vertical interconnect, thus speeding up significantly the common case. The interface still supports a convenient global address space abstraction with high-latency remote access, due to the slower horizontal interconnect. Experimental results demonstrate significant bandwidth improvement that ranges from 1.44?? to 7.40?? as compared to the JEDEC standard, with peaks of 4.53 GB/s for direct memory access, and 850 MB/s for remote access through the NoC.
Keywords :
DRAM chips; integrated circuit design; memory architecture; multiprocessing systems; network-on-chip; 3D integration; 3D stacked DRAM; NoC-based many-core architecture; TSV technology; architectural interface; distributed memory interface; energy efficiency; high-latency remote access; many-core platform; memory interface bandwidth; memory module; processor performance; speed; stacked memory; ultra-low-latency access; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457230
Filename :
5457230
Link To Document :
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