Title :
AgeSim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs
Author :
Huang, Lin ; Xu, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating the lifetime reliability of processor-based system-on-a-chips (SoCs), namely AgeSim, which facilitates designers to make design decisions that affect SoCs´ mean time to failure. Unlike existing work, AgeSim can simulate failure mechanisms with arbitrary lifetime distributions and do not require to trace the system´s reliability-related factors over its entire lifetime, and hence is more efficient and accurate. Two case studies are conducted to show the flexibility and effectiveness of the proposed methodology.
Keywords :
circuit reliability; logic design; system-on-chip; AgeSim; aggressive technology scaling; failure mechanism; lifetime reliability; processor-based SoC; simulation framework; system-on-a-chip; Aging; Circuit simulation; Computational modeling; Failure analysis; Power system reliability; Redundancy; System-on-a-chip; Temperature dependence; Thermal management; Voltage;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457238