DocumentCode
2260343
Title
A semi-digital interface for capacitive sensors
Author
Ali-Bakhshian, Mohammad ; Roberts, Gordon W.
Author_Institution
Dept. Of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
fYear
2009
fDate
24-27 May 2009
Firstpage
1957
Lastpage
1960
Abstract
A new technique and circuit topology is proposed to readout the output of a capacitive sensor for lab on chip (LOC) applications. Using time-mode signal processing and adopting modified digital blocks, a first-order delta-sigma interface is developed. It offers an incredibly compact and low-power solution where analog precision is achieved by making advantage of digital design. The design is capable of being tuned for different ranges of input capacitance as well as different resolutions where applicable. The proposed circuit is layout in 0.8-mum DALSA CMOS process. Post-layout simulation shows a capacitance change of 5 fF can be measured with error less than 2% in 500 mus. Also, the resolution of the circuit can be increased by 25 times to measure an input capacitance as small as 0.2 fF.
Keywords
CMOS integrated circuits; capacitive sensors; network topology; DALSA CMOS process; capacitive sensor; circuit topology; delta-sigma interface; lab on chip; semidigital interface; size 0.8 micron; time-mode signal processing; Capacitance measurement; Capacitive sensors; Capacitors; Circuit topology; Current measurement; Lab-on-a-chip; Micromechanical devices; Signal processing; Signal resolution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118173
Filename
5118173
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