DocumentCode :
2260429
Title :
Large strain-induced conductivity anisotropy in VO2 thin films probed by THz spectroscopy
Author :
Liu, Mengkun ; Abreu, Elsa ; Lu, Jiwei ; West, Kevin G. ; Kittiwatanakul, Salinporn ; Yin, Wenjing ; Wolf, Stuart ; Averitt, Richard D.
Author_Institution :
Dept. of Phys., Boston Univ., Boston, MA, USA
fYear :
2011
fDate :
1-6 May 2011
Firstpage :
1
Lastpage :
2
Abstract :
We probe the temperature dependent far-infrared conductivity of highly strained (100)VO2 thin films using THz TDS. A large in-plane anisotropy is observed in both the metallic conductivity and the metal-insulator transition temperature.
Keywords :
electrical conductivity; high-speed optical techniques; infrared spectra; insulating thin films; metal-insulator transition; terahertz wave spectra; vanadium compounds; VO2; large strain-induced conductivity anisotropy; metal-insulator transition temperature; metallic conductivity; temperature dependent far-infrared conductivity; terahertz time domain spectroscopy; thin films; Anisotropic magnetoresistance; Conductivity; Films; Spectroscopy; Strain; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
Type :
conf
Filename :
5951472
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2260429
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