Title :
Proceedings. 13th Asian Test Symposium
Abstract :
The following topics are dealt with: SOC testing; low-power testing; analog BIST; advanced DFT; fault analysis; crosstalk testing; functional testing; logic BIST; fault diagnosis; SOC test scheduling; memory testing; analog testing; testable design; testability analysis; yield and reliability; fault tolerance; FPGA testing; test reduction and delay testing.
Keywords :
built-in self test; design for testability; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; integrated circuit yield; logic testing; system-on-chip; FPGA testing; SOC testing; advanced DFT; analog BIST; analog testing; crosstalk testing; delay testing; fault analysis; fault diagnosis; fault tolerance; functional testing; logic BIST; low-power testing; memory testing; test reduction; test reliability; test scheduling; test yield; testability analysis; testable design;
Conference_Titel :
Test Symposium, 2004. 13th Asian
Conference_Location :
Kenting, Taiwan
Print_ISBN :
0-7695-2235-1
