• DocumentCode
    2260764
  • Title

    Nanomanipulation using atomic force microscope with drift compensation

  • Author

    Yang, Qinmin ; Jagannathan, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO
  • fYear
    2006
  • fDate
    14-16 June 2006
  • Abstract
    This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on the substrates since it is tedious for human. A block phase correlation-based algorithm is embedded into the controller for compensating the thermal drift during nanomanipulation. Further, a neural network (NN) is employed to approximate the unknown nanoparticle and substrate contact dynamics including the roughness effects. Using the NN-based adaptive force controller the task of pushing nanoparticles is demonstrated. Finally, using the Lyapunov-based stability analysis, the uniform ultimately boundedness (UUB) of the closed-loop signals is demonstrated
  • Keywords
    Lyapunov methods; adaptive control; atomic force microscopy; closed loop systems; compensation; control system analysis; force control; manipulators; neurocontrollers; stability; substrates; Lyapunov-based stability analysis; adaptive force controller; atomic force microscope; block phase correlation; closed-loop signals; nanomanipulation; nanoparticles; neural network; roughness effects; substrate contact dynamics; substrates; thermal drift compensation; uniform ultimately boundedness; Adhesives; Atomic force microscopy; Atomic measurements; Electrostatics; Friction; Gold; Rough surfaces; Sampling methods; Substrates; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2006
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    1-4244-0209-3
  • Electronic_ISBN
    1-4244-0209-3
  • Type

    conf

  • DOI
    10.1109/ACC.2006.1655408
  • Filename
    1655408