DocumentCode :
2260764
Title :
Nanomanipulation using atomic force microscope with drift compensation
Author :
Yang, Qinmin ; Jagannathan, S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO
fYear :
2006
fDate :
14-16 June 2006
Abstract :
This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on the substrates since it is tedious for human. A block phase correlation-based algorithm is embedded into the controller for compensating the thermal drift during nanomanipulation. Further, a neural network (NN) is employed to approximate the unknown nanoparticle and substrate contact dynamics including the roughness effects. Using the NN-based adaptive force controller the task of pushing nanoparticles is demonstrated. Finally, using the Lyapunov-based stability analysis, the uniform ultimately boundedness (UUB) of the closed-loop signals is demonstrated
Keywords :
Lyapunov methods; adaptive control; atomic force microscopy; closed loop systems; compensation; control system analysis; force control; manipulators; neurocontrollers; stability; substrates; Lyapunov-based stability analysis; adaptive force controller; atomic force microscope; block phase correlation; closed-loop signals; nanomanipulation; nanoparticles; neural network; roughness effects; substrate contact dynamics; substrates; thermal drift compensation; uniform ultimately boundedness; Adhesives; Atomic force microscopy; Atomic measurements; Electrostatics; Friction; Gold; Rough surfaces; Sampling methods; Substrates; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2006
Conference_Location :
Minneapolis, MN
Print_ISBN :
1-4244-0209-3
Electronic_ISBN :
1-4244-0209-3
Type :
conf
DOI :
10.1109/ACC.2006.1655408
Filename :
1655408
Link To Document :
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