Title :
Nonlinear analysis of dynamic force microscopy
Author :
Jiang, Jingbo ; Marquez, Horacio J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta.
Abstract :
Dynamic force microscopy is a powerful tool to image non-conductive materials with atomic resolution using the nonlinear interaction force. A perturbation method is extended to analyze the nonlinear oscillation dynamics of the frequency modulation dynamic force microscopy. A general resonant frequency shift formula is derived for both conservative and dissipative interaction forces, and validation conditions are provided. Furthermore, the approximate motions of higher resonances are derived, which provide in depth analysis of force-motion relation, and can be applied for force sensing when amplitudes of higher resonances are measurable
Keywords :
atomic force microscopy; control system analysis; frequency modulation; nonlinear control systems; open loop systems; perturbation techniques; atomic resolution; conservative interaction forces; dissipative interaction forces; force sensing; force-motion relation; frequency modulation dynamic force microscopy; general resonant frequency shift formula; nonconductive materials; nonlinear analysis; nonlinear interaction force; nonlinear oscillation dynamics; perturbation method; Atomic force microscopy; Design for manufacture; Equations; Force measurement; Frequency; Image resolution; Lagrangian functions; Power engineering and energy; Resonance; Steady-state;
Conference_Titel :
American Control Conference, 2006
Conference_Location :
Minneapolis, MN
Print_ISBN :
1-4244-0209-3
Electronic_ISBN :
1-4244-0209-3
DOI :
10.1109/ACC.2006.1655409
