Title :
Multi-frequency test access mechanism design for modular SOC testing
Author :
Xu, Qiang ; Nicolici, Nicola
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Abstract :
This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.
Keywords :
design for testability; integrated circuit testing; system-on-chip; bandwidth matching concept; modular SOC testing; multifrequency test access mechanism; multifrequency virtual TAM; system-on-a-chip test application time; Application software; Bandwidth; Dynamic scheduling; Integer linear programming; Optimal scheduling; Partitioning algorithms; Simulated annealing; System testing; System-on-a-chip; Wires; Multi-frequency Virtual TAM; SOC testing;
Conference_Titel :
Test Symposium, 2004. 13th Asian
Print_ISBN :
0-7695-2235-1
DOI :
10.1109/ATS.2004.60
