DocumentCode
2260983
Title
Multi-frequency test access mechanism design for modular SOC testing
Author
Xu, Qiang ; Nicolici, Nicola
Author_Institution
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
fYear
2004
fDate
15-17 Nov. 2004
Firstpage
2
Lastpage
7
Abstract
This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.
Keywords
design for testability; integrated circuit testing; system-on-chip; bandwidth matching concept; modular SOC testing; multifrequency test access mechanism; multifrequency virtual TAM; system-on-a-chip test application time; Application software; Bandwidth; Dynamic scheduling; Integer linear programming; Optimal scheduling; Partitioning algorithms; Simulated annealing; System testing; System-on-a-chip; Wires; Multi-frequency Virtual TAM; SOC testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.60
Filename
1376527
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