Title :
Table of contents
Abstract :
The following topics are dealt with: ULIS; tunelling devices; gate-stacks, non-silicon channels; limits of scaling; sensing; and novel device concepts.
Keywords :
elemental semiconductors; semiconductor devices; sensors; silicon; tunnelling; ULIS; device concepts; gate-stacks; limits of scaling; nonsilicon channels; tunelling devices; ultimate integration on silicon;
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
Conference_Location :
Coventry
Print_ISBN :
978-1-4673-4800-3
Electronic_ISBN :
978-1-4673-4801-0
DOI :
10.1109/ULIS.2013.6523535