DocumentCode :
22612
Title :
A Low-Complexity Multiple Error Correcting Architecture Using Novel Cross Parity Codes Over GF (2^{m})
Author :
Poolakkaparambil, Mahesh ; Mathew, Jimson ; Jabir, Abusaleh M. ; Pradhan, Dhiraj K.
Author_Institution :
Dept. of Comput. & Commun. Technol., Oxford Brookes Univ., Oxford, UK
Volume :
23
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
1448
Lastpage :
1458
Abstract :
This paper presents a novel low-complexity cross parity code, with a wide range of multiple bit error correction capability at a lower overhead, for improving the reliability in circuits over GF(2m). For an m input circuit, the proposed scheme can correct m ≤ Dw ≤ 3m/2 -1 multiple error combinations out of all the possible 2m - 1 errors, which is superior to many existing approaches. From the mathematical and practical evaluations, the best case error correction is m/2 bit errors. Tests on 80-bit parallel and, for the first time, on 163-bit Federal Information Processing Standard/National Institute of Standards and Technology (FIPS/NIST) standard word-level Galois field (GF) multipliers, suggest that it requires only 106% and 170% area overheads, respectively, which is lower than the existing approaches, while error injection-based behavioral analysis demonstrates its wider error correction capability.
Keywords :
circuit reliability; error correction; parity check codes; FIPS/NIST standard; Federal Information Processing Standard; GF multiplier; National Institute of Standards and Technology; circuit reliability; cross parity codes; error correction capability; low-complexity multiple error correcting architecture; word-level Galois field multiplier; Computer architecture; Cryptography; Decoding; Encoding; Error correction; Error correction codes; Standards; Application specific integrated circuits (ASICs); Bose–Choudhury–Hocquenghem (BCH) code; Bose???Choudhury???Hocquenghem (BCH) code; Galois field (GF); VLSI; error correction circuit (ECC); multiple event upsets (MEUs); radiation hardening; simple parity; single event upsets (SEUs);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2341631
Filename :
6876030
Link To Document :
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