Title :
The augmented 3D-tree fault-tolerant network
Author :
Belkadi, Mustapha ; Mouftah, H.T.
Author_Institution :
Dept. of Electr. Eng., Queen´´s Univ., Kingston, Ont., Canada
Abstract :
The present paper discusses the design and reliability analysis of the Augmented 3D-Tree Switching network (A3DT). The latter was developed as a result of the vulnerability of the 3D-Tree (3DT) switching network towards certain critical multiple-fault patterns that cause cell loss under a dynamic rerouting scheme even though other fault-free paths might exist. The A3DT network is based on 4×6 Switching Elements (SE) interconnected in such a way as to enhance the immunity of the 3DT network towards the multiple-fault patterns under consideration; yet without destroying the properties of the underlying network
Keywords :
fault tolerant computing; fault trees; multistage interconnection networks; network routing; augmented 3D-tree fault-tolerant network; cell sequencing; critical multiple-fault patterns; dynamic rerouting scheme; multistage interconnection networks; reliability analysis; switching elements interconnection; Algorithm design and analysis; Degradation; Design methodology; Fault tolerance; Joining processes; Multiprocessor interconnection networks; Redundancy; Routing; Tree graphs;
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
0-7803-1760-2
DOI :
10.1109/MWSCAS.1993.342970
