مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2261574

Title :

Session III: Qualification

fYear :

2009

fDate :

11-11 Oct. 2009

Firstpage :

Lastpage :

Abstract :

Start of the above-titled section of the conference proceedings record.

Keywords :

Electron Devices Society; Gallium arsenide; Qualifications; Reliability engineering;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability of Compound Semiconductors Digest (ROCS), 2009

Conference_Location :

Greensboro, NC

Print_ISBN :

978-0-7908-0124-7

Type :

conf

Filename :

5313972

Link To Document :