• DocumentCode
    2261692
  • Title

    Test instruction set (TIS) for high level self-testing of CPU cores

  • Author

    Shamshiri, Saeed ; Esmaeilzadeh, Hadi ; Navabi, Zainalabedin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tehran Univ., Iran
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    158
  • Lastpage
    163
  • Abstract
    TIS (test instruction set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replaces the NOP instruction that is available in most processors with test instructions so that online testing can be done with no performance penalty. This method can be applied to both offline and online (concurrent) testing of all types of processors (single-cycle, multi-cycle and pipelined). TIS is appropriate for pipelined architectures in which one or many NOP instructions (or stalls) are inserted between instructions that are data or control dependent. We have implemented this test method on a pipelined CPU core and several test programs for this pipelined CPU are used to illustrate the method. Also fault coverage results are presented to demonstrate the effectiveness of the TIS test technique.
  • Keywords
    built-in self test; circuit analysis computing; instruction sets; integrated circuit testing; logic testing; microprocessor chips; CPU core self-testing; CPU instruction set; high level self-testing; pipelined CPU core; processor testing; test instruction set; Automatic testing; Built-in self-test; Central Processing Unit; Circuit faults; Circuit testing; Computer aided instruction; Costs; Pins; Process design; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.81
  • Filename
    1376552