DocumentCode :
2261692
Title :
Test instruction set (TIS) for high level self-testing of CPU cores
Author :
Shamshiri, Saeed ; Esmaeilzadeh, Hadi ; Navabi, Zainalabedin
Author_Institution :
Dept. of Electr. & Comput. Eng., Tehran Univ., Iran
fYear :
2004
fDate :
15-17 Nov. 2004
Firstpage :
158
Lastpage :
163
Abstract :
TIS (test instruction set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replaces the NOP instruction that is available in most processors with test instructions so that online testing can be done with no performance penalty. This method can be applied to both offline and online (concurrent) testing of all types of processors (single-cycle, multi-cycle and pipelined). TIS is appropriate for pipelined architectures in which one or many NOP instructions (or stalls) are inserted between instructions that are data or control dependent. We have implemented this test method on a pipelined CPU core and several test programs for this pipelined CPU are used to illustrate the method. Also fault coverage results are presented to demonstrate the effectiveness of the TIS test technique.
Keywords :
built-in self test; circuit analysis computing; instruction sets; integrated circuit testing; logic testing; microprocessor chips; CPU core self-testing; CPU instruction set; high level self-testing; pipelined CPU core; processor testing; test instruction set; Automatic testing; Built-in self-test; Central Processing Unit; Circuit faults; Circuit testing; Computer aided instruction; Costs; Pins; Process design; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. 13th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2235-1
Type :
conf
DOI :
10.1109/ATS.2004.81
Filename :
1376552
Link To Document :
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