Title :
A robustness measure for hypercube networks
Author :
Latifi, Shahram ; Rai, Suresh
Author_Institution :
Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA
Abstract :
This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between two nodes s and t of Hamming distance H(s,t). in hypercube networks (Bn). The shortest distance restriction guarantees optimal communication delay between processors and high link/node utilization across the network. Moreover, it provides a measure for the robustness of the network. In particular, when H(s,t)=n in Bn, DR will yield the probability of degradation in the diameter, a concept which directly relates to fault-diameter. The paper proposes two schemes to evaluate DR in Bn. The first scheme uses a combinatorial approach by limiting the number of faulty components to (2H(s,t)-2), while the second outlines paths of length H(s,t) and, then, generates a recursive closed-form solution to compute DR. The theoretical results have been verified by simulation. The discrepancy between the theoretical and simulation results is in most cases below 1% and in the worst case 4.6%
Keywords :
combinatorial mathematics; failure analysis; hypercube networks; probability; reliability theory; Hamming distance; constrained two-terminal reliability measure; distance reliability; hypercube networks; optimal communication delay; probability; robustness measure; Availability; Closed-form solution; Computational modeling; Degradation; Hamming distance; Hypercubes; Parallel processing; Robustness; Telecommunication network reliability; Topology;
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
0-7803-1760-2
DOI :
10.1109/MWSCAS.1993.342988