DocumentCode :
2261902
Title :
Machine model ESD tester for enhanced capacitor reliability
Author :
Marchut, L. ; Antonell, M. ; Fresina, M. ; Novak, C. ; Meeder, M. ; Darche, T. ; Chamberlain, S. ; Antonell, J.
Author_Institution :
RFMD, Inc., Greensboro, NC, USA
fYear :
2009
fDate :
11-11 Oct. 2009
Firstpage :
85
Lastpage :
95
Abstract :
Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate actual field failures when compared to using on-wafer DC ramp-to-failure voltage testing.
Keywords :
capacitors; electrostatic discharge; reliability; testing; ESD tester; electro-static discharge; enhanced capacitor; machine model; product qualification; reliability; Assembly; Breakdown voltage; Cathode ray tubes; Dielectrics; Electrostatic discharge; Insertion loss; MIM capacitors; Radio frequency; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Compound Semiconductors Digest (ROCS), 2009
Conference_Location :
Greensboro, NC
Print_ISBN :
978-0-7908-0124-7
Type :
conf
Filename :
5313984
Link To Document :
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