Title :
Machine model ESD tester for enhanced capacitor reliability
Author :
Marchut, L. ; Antonell, M. ; Fresina, M. ; Novak, C. ; Meeder, M. ; Darche, T. ; Chamberlain, S. ; Antonell, J.
Author_Institution :
RFMD, Inc., Greensboro, NC, USA
Abstract :
Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate actual field failures when compared to using on-wafer DC ramp-to-failure voltage testing.
Keywords :
capacitors; electrostatic discharge; reliability; testing; ESD tester; electro-static discharge; enhanced capacitor; machine model; product qualification; reliability; Assembly; Breakdown voltage; Cathode ray tubes; Dielectrics; Electrostatic discharge; Insertion loss; MIM capacitors; Radio frequency; Switches; System testing;
Conference_Titel :
Reliability of Compound Semiconductors Digest (ROCS), 2009
Conference_Location :
Greensboro, NC
Print_ISBN :
978-0-7908-0124-7