DocumentCode :
2262107
Title :
Berger code self-testing checkers with partitioning and folding scheme
Author :
Lai, Chia-shun ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
1993
fDate :
16-18 Aug 1993
Firstpage :
530
Abstract :
Due to the salient feature of the least redundant separable codes, Berger codes have been implemented for fault-tolerant, fail-safe, and concurrent error testable designs of digital circuits and systems. The features of high speed and low hardware cost are highly desirable, especially for a checker design. A fast self-testing checker (STC) design of Berger code implemented with partitioning scheme has been proposed recently. The design offers an improvement in delay, but still high hardware overhead. In this paper, an alternative partitioning scheme manipulating the most significant check bit is proposed. Results show that, implementing with the proposed partitioning scheme, the number of m/n sub-checkers required in a STC design can be reduced by half, and the hardware reduction can be as much as 50%
Keywords :
automatic testing; built-in self test; digital integrated circuits; error detection codes; integrated circuit testing; logic testing; Berger code self-testing checkers; fast STC design; folding scheme; hardware reduction; most significant check bit; partitioning; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Delay; Design engineering; Digital circuits; Hardware; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
0-7803-1760-2
Type :
conf
DOI :
10.1109/MWSCAS.1993.343003
Filename :
343003
Link To Document :
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