RAIN (RAndom INsertion) scheduling algorithm for SoC test

This paper presents a new SoC (system-on-chip) test scheduling algorithm. Reducing the test application time is an important issue for a core-based SoC test. In this paper, each core is represented by a rectangle, the height of which is equal to the TAM width and the width of which is equal to the test time. A ´one-element-exchange´ algorithm is used for optimizing the test time of each core and the ´RAIN´ scheduling algorithm is used for optimizing the test time of SoC. The RAIN scheduling algorithm uses a sequence pair data structure to represent the placement of rectangles, and obtains the optimized results by inserting into a random position on the sequence pair. The results of the experiments conducted using ITC ´02 SoC benchmarks show that the proposed algorithm gives the shortest test application time compared with earlier researches for most of the cases.