DocumentCode :
2262145
Title :
Thin-film removal using ultrashort laser pulses
Author :
Magyar, J. ; Sklyarov, A. ; Yakovlev, Vladislav V.
Author_Institution :
Dept. of Phys., Wisconsin Univ., Milwaukee, WI, USA
fYear :
2002
fDate :
24-24 May 2002
Abstract :
Summary form only given. The use of lasers for surface cleaning and thin film removal has emerged as a promising technology that meets the above requirements. During the last several years this technique has been rapidly moving into commercial applications. Most of these applications, however, require removing coatings that are not strongly adherent to the surface. In the case of oxide films, the major obstacle is controlling significant damage to the underlying surface. For our initial experiments we used commercial Nd:YAG laser system (Q-switched, pulse duration 7 ns) to remove a thermally grown SiO/sub 2/ coating from the surface of a Si wafer.
Keywords :
Q-switching; high-speed optical techniques; laser materials processing; silicon compounds; surface cleaning; 7 ns; Nd:YAG laser system; Q-switched; Si wafer; SiO/sub 2/; YAG:Nd; YAl5O12:Nd; coatings; laser surface cleaning; oxide films; pulse duration; thermally grown SiO/sub 2/ coating; thin film removal; thin-film removal; ultrashort laser pulses; underlying surface damage control; Biomedical optical imaging; Cleaning; Electric breakdown; Laser theory; Optical materials; Optical pulses; Paints; Photonics; Transistors; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033479
Filename :
1033479
Link To Document :
بازگشت