Optimized metrology for accurate laser damage measurements

Author

Gallais, L. ; Natoli, J.Y.

Author_Institution

Ecole Nationale Superieure de Phys. de Marseille, CNRS, Marseille, France

fYear

2002

fDate

24-24 May 2002

Firstpage

98

Abstract

Summary form only given. Laser induced damage threshold is linked to many factors such as the damage criteria, test procedure, pulse duration, spot size, and wavelength. This induces difficulty to make comparisons, or compilations of results and reach on an absolute measurement. This absolute measurement of laser damage requires a high level of sensitivity and a perfect knowledge of the apparatus characteristics. In this context we have upgrade the metrology of our set up to control and know the influence of each parameter on laser-induced damage threshold measurement.

Keywords

laser beam effects; measurement errors; optimisation; sensitivity; absolute measurement; accurate laser damage measurements; apparatus characteristics; damage criteria; laser induced damage threshold; laser-induced damage threshold measurement; optimized metrology; pulse duration; sensitivity; spot size; test procedure; Atomic measurements; Laser beams; Laser theory; Metrology; Optical pulses; Optimized production technology; Pulse measurements; Testing; Waveguide lasers; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-706-7

Type

conf

DOI

10.1109/CLEO.2002.1033482

Filename

1033482