• DocumentCode
    2262254
  • Title

    Implementing IEEE 1641 - amplifier characterisation on multiple test platforms

  • Author

    Cornish, Matt ; Brown, Malcolm ; Ganzert, Johannes

  • Author_Institution
    EADS TES (UK) Ltd., Wimborne, UK
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    256
  • Lastpage
    261
  • Abstract
    A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 164trade Signal & Test Definition . The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML . In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement . The implementation platform consists of Rohde & Schwarz´s Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard´s Test Signal Framework (TSF); use is made of the Standard´s Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform´s native IVI and executed, all using the same source.
  • Keywords
    IEEE standards; amplifiers; circuit analysis computing; network analysers; signal generators; spectral analysers; COM interface; IEEE 1641; IEEE ATML; IEEE ATML Test Station; Rohde & Schwarz vector signal generator; UK MoD; XML document; amplifier characterisation; mobile communications device; signal modelling language; spectrum analyser; test program; test signal framework standard; vector network analyser; Gain measurement; Instruments; Power supplies; Radio frequency; Signal analysis; Signal generators; Signal mapping; Software testing; Voltage; XML; 1641; ATML; IEEE; IVI; Implementation; Signal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314000
  • Filename
    5314000