DocumentCode :
2262254
Title :
Implementing IEEE 1641 - amplifier characterisation on multiple test platforms
Author :
Cornish, Matt ; Brown, Malcolm ; Ganzert, Johannes
Author_Institution :
EADS TES (UK) Ltd., Wimborne, UK
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
256
Lastpage :
261
Abstract :
A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 164trade Signal & Test Definition . The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML . In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement . The implementation platform consists of Rohde & Schwarz´s Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard´s Test Signal Framework (TSF); use is made of the Standard´s Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform´s native IVI and executed, all using the same source.
Keywords :
IEEE standards; amplifiers; circuit analysis computing; network analysers; signal generators; spectral analysers; COM interface; IEEE 1641; IEEE ATML; IEEE ATML Test Station; Rohde & Schwarz vector signal generator; UK MoD; XML document; amplifier characterisation; mobile communications device; signal modelling language; spectrum analyser; test program; test signal framework standard; vector network analyser; Gain measurement; Instruments; Power supplies; Radio frequency; Signal analysis; Signal generators; Signal mapping; Software testing; Voltage; XML; 1641; ATML; IEEE; IVI; Implementation; Signal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314000
Filename :
5314000
Link To Document :
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