Dynamic analog testing via ATE digital test channels

Author

Su, C.C. ; Chang, C.S. ; Huang, H.W. ; Tu, D.S. ; Lee, C.-L. ; Lin, Jerry C H

Author_Institution

Dept. of Electr. & Control Engr., National Chiao Tung Univ., HsinChu, Taiwan

fYear

2004

fDate

15-17 Nov. 2004

Firstpage

308

Lastpage

312

Abstract

A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.

Keywords

analogue circuits; automatic test equipment; circuit optimisation; circuit testing; comparators (circuits); monolithic integrated circuits; statistical analysis; waveform generators; ATE digital test channels; device interface board; digital pin electronic circuit; digital tester; dual comparators; dynamic analog testing; noise effect minimization; quantization resolution; response waveform quantization; statistical analysis; stimulus generation; triangular waveform; Circuit noise; Circuit testing; Costs; Digital signal processing; Electronic circuits; Electronic equipment testing; Quantization; Signal generators; Statistical analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2004. 13th Asian

ISSN

1081-7735

Print_ISBN

0-7695-2235-1

Type

conf

DOI

10.1109/ATS.2004.37

Filename

1376576