Title :
A high temperature pressure sensor with β-SiC piezoresistors on SOI substrates
Author :
Ziermann, René ; Von Berg, Jochen ; Reichert, Walter ; Obermeier, Ernst ; Eickhoff, Martin ; Krötz, Gerhard
Author_Institution :
Microsensor & Actuator Technol. Center, Tech. Univ. of Berlin, Germany
Abstract :
This paper reports about the first piezoresistive pressure sensor for high operating temperatures using single crystalline, n-type β-SiC piezoresistors on Silicon On Insulator (SOI) substrates. The new Silicon Carbide On Insulator (SiCOI) layer structure prevents a leakage current flow through the substrate at high temperatures up to 723 K. The sensor was tested in the temperature range between room temperature and 573 K. The sensitivity of the device at room temperature is approximately 20.2 μV/VkPa. This corresponds to a longitudinal gauge factor of -32 in the [100]-direction. The Temperature Coefficient of Sensitivity (TCS) is -0.16 %K-1 at 573 K
Keywords :
electric sensing devices; microsensors; piezoresistive devices; pressure sensors; semiconductor materials; silicon compounds; silicon-on-insulator; 293 to 723 K; SOI substrates; SiC; high temperature pressure sensor; longitudinal gauge factor; piezoresistors; sensitivity; temperature coefficient of sensitivity; Crystallization; Insulation; Insulator testing; Leakage current; Piezoresistance; Piezoresistive devices; Silicon carbide; Silicon on insulator technology; Temperature distribution; Temperature sensors;
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
DOI :
10.1109/SENSOR.1997.635502