DocumentCode
2262476
Title
An intelligent fault diagnosis method for electrical equipment using infrared images
Author
Hui, Zou ; Fuzhen, Huang
Author_Institution
College of Automation Engineering, Shanghai University of Electric Power, Shanghai 200090, China
fYear
2015
fDate
28-30 July 2015
Firstpage
6372
Lastpage
6376
Abstract
Infrared thermography(IRT) plays a very important role in monitoring and inspecting thermal defects of electrical equipment without shutting down, which has an important significance for the stability of power systems. Manual analysis of infrared images for detecting defects and classifying the status of equipment may take a lot of time and efforts, and may also lead to incorrect diagnosis results. To surmount the lack of manual analysis of infrared images, intelligent fault diagnosis methods for electrical equipment are proposed recently, but there are two difficulties when using these methods: one is to find the region of interest, another is to extract features which can represent the condition of electrical equipment, as it is difficult to segment infrared images due to the over-centralized distribution and low intensity contrast of infrared images, which is quite different from that of visual light images. To overcome these two difficulties, a novel intelligent fault diagnosis approach for electrical equipment is presented in this paper. Firstly the infrared image of electric equipment is clustered into five regions using K-means algorithm, then statistical characteristics in each region is extracted, and all these characteristics of five regions are combined as the image features. These features are subsequently input to a support vector machine(SVM) which is utilized as an intelligent diagnosis system. To reinforce the SVM classification performance, a parameter optimization approach is adopted. The experimental results show the efficiency of our proposed method.
Keywords
Artificial intelligence; Clustering algorithms; Fault diagnosis; Feature extraction; Optimization; Support vector machines; Training; Feature extraction; Infrared image; Intelligent fault diagnosis; Parameter optimization; Support vector machine;
fLanguage
English
Publisher
ieee
Conference_Titel
Control Conference (CCC), 2015 34th Chinese
Conference_Location
Hangzhou, China
Type
conf
DOI
10.1109/ChiCC.2015.7260642
Filename
7260642
Link To Document