DocumentCode :
2262494
Title :
Circuit-width based heuristic for Boolean reasoning
Author :
Li, Guanghui ; Li, Xiaowei
Author_Institution :
Sch. of Inf. Eng., Zhejiang Forestry Coll., Hangzhou, China
fYear :
2004
fDate :
15-17 Nov. 2004
Firstpage :
336
Lastpage :
341
Abstract :
Binary decision diagram (BDD) and Boolean satisfiability (SAT) are two common techniques of logic circuit-based Boolean reasoning. Since circuit-width is a good measure of circuit complexity, in this paper, a circuit-width based heuristic for Boolean reasoning is presented, it can be used for integrating the BDD-based engine and SAT-based engine, and takes advantages of both engines. Thus this heuristic can avoid the potential memory explosion during constructing the BDDs, and can prevent the time-out phenomenon of SAT techniques. Compared with the previous heuristics, the proposed heuristic can save more computational resources, and can improve the performance of Boolean reasoning algorithms. This heuristic has been applied in combinational circuit test generation successfully. Experimental results show that, the proposed heuristic can be used for the Boolean reasoning with multiple engines efficiently.
Keywords :
Boolean functions; automatic test pattern generation; binary decision diagrams; circuit complexity; combinational circuits; computability; logic testing; BDD-based engine; Boolean satisfiability; SAT-based engine; binary decision diagram; circuit complexity; circuit-width; combinational circuit test generation; logic circuit-based Boolean reasoning; time-out phenomenon; Binary decision diagrams; Boolean functions; Circuit testing; Combinational circuits; Complexity theory; Data structures; Engines; Explosions; Integrated circuit measurements; Logic circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. 13th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2235-1
Type :
conf
DOI :
10.1109/ATS.2004.30
Filename :
1376581
Link To Document :
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