DocumentCode :
2262702
Title :
IEEE Std 1641
Author :
Gorringe, Chris
Author_Institution :
EADS Test Eng. Services (UK) Ltd., Wimborne, UK
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
241
Lastpage :
245
Abstract :
Over the past three years, the IEEE Std 1641 Signal & Test Definition standard has been evolving and maturing. This year its first revision is set to come out. This paper discusses the changes and improvements incorporated within the revised draft standard and identifies how this standard has been integrated into other test standards, such as ATML. In most cases, the revised standard clarifies existing practices and removes inherent ambiguity. The new revision is now based far more on its XML pedigree, deferring its original ATLAS roots, whilst still supporting those legacy signals. The revised standard has also introduced some new components to better support digital and protocol testing. These new components bridge the gap between analogue and event signals, something that the original standard supported but did not provide any detail on. The revised standard now provides a comprehensive set of building blocks supporting analogue, events, and digital signals.
Keywords :
IEEE standards; automatic testing; IEEE Std 1641; XML; analogue signals; digital signals; event signals; revised standard; signal & test definition standard; Area measurement; Bridges; Hardware; Impedance measurement; Logic gates; Monitoring; Protocols; Signal processing; Testing; XML; ATE; ATS; IEEE Std 1641; signal modeling; test definitions; test requirements; test signals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314021
Filename :
5314021
Link To Document :
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