DocumentCode :
2262742
Title :
A Direct Segmentation Algorithm Based on Adaptive Fuzzy c-Elliptotype Clustering in Reverse Engineering
Author :
Liu, Xuemei ; Huangfu, Zhongmin ; Hou, Xuemei
Author_Institution :
North China Inst. of Water Conservancy & Hydroelectric Power, Zhengzhou
Volume :
2
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
47
Lastpage :
50
Abstract :
Reverse engineering is the process of converting a large measured point cloud into a CAD model. The key issue is segmentation, i.e. how to subdivide the point cloud into smaller regions, where each of which can be approximated by a single surface. This paper presents segmentation algorithm based on adaptive fuzzy c-elliptotype clustering for point cloud in reverse engineering. Fuzzy c-planes clustering is added to the classic fuzzy c-means algorithm by convex combination. The combination coefficient is selected adaptively according to size of planes by a heuristic technique. The differential geometric features that are necessary in the conventional segmentation algorithm do not need to be computed. The number of clusters is determined by competitive agglomeration technique. The algorithm is benefit to extract geometric parameters of surface accurately in next step. The experiment results prove that this algorithm is valid.
Keywords :
CAD; differential geometry; fuzzy set theory; image segmentation; pattern clustering; reverse engineering; CAD model; adaptive fuzzy c-elliptotype clustering; competitive agglomeration technique; differential geometric features; direct segmentation algorithm; fuzzy c-means algorithm; fuzzy c-planes clustering; point cloud; reverse engineering; Clouds; Clustering algorithms; Design automation; Information technology; Large-scale systems; Optical noise; Power measurement; Reverse engineering; Surface fitting; Water conservation; point cloud; reverse engineering; segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3497-8
Type :
conf
DOI :
10.1109/IITA.2008.283
Filename :
4739724
Link To Document :
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