• DocumentCode
    2262806
  • Title

    Diagnosability of discrete event systems and its applications to circuit testing

  • Author

    Feng Lin ; Lin, Feng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
  • fYear
    1993
  • fDate
    16-18 Aug. 1993
  • Firstpage
    344
  • Abstract
    As man-made systems become more and more complex, diagnostics of component failures is no longer an easy task that can be performed based on experience and intuition. Therefore, it is important to develop a systematic approach to diagnostic problems. Diagnostics can be done either on-line or off-line. By on-line diagnostics, we mean diagnostics performed while the system to be diagnosed is in normal operation. On the other hand, in off-line diagnostics, the system is not in normal operation. We mainly study off-line diagnostics in this paper. We also introduce the concept of diagnosability and study its properties, all in the framework of discrete event systems. This study is motivated by diagnostic problems in the automotive industry and we emphasize its applications.<>
  • Keywords
    circuit testing; discrete event systems; fault diagnosis; automotive industry; circuit testing; diagnosability; discrete event systems; offline diagnostics; online diagnostics; Actuators; Application software; Automobiles; Automotive engineering; Circuit testing; Control systems; Discrete event systems; Engines; Observability; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
  • Conference_Location
    Detroit, MI, USA
  • Print_ISBN
    0-7803-1760-2
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1993.343039
  • Filename
    343039