Title :
Diagnosability of discrete event systems and its applications to circuit testing
Author :
Feng Lin ; Lin, Feng
Author_Institution :
Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
As man-made systems become more and more complex, diagnostics of component failures is no longer an easy task that can be performed based on experience and intuition. Therefore, it is important to develop a systematic approach to diagnostic problems. Diagnostics can be done either on-line or off-line. By on-line diagnostics, we mean diagnostics performed while the system to be diagnosed is in normal operation. On the other hand, in off-line diagnostics, the system is not in normal operation. We mainly study off-line diagnostics in this paper. We also introduce the concept of diagnosability and study its properties, all in the framework of discrete event systems. This study is motivated by diagnostic problems in the automotive industry and we emphasize its applications.<>
Keywords :
circuit testing; discrete event systems; fault diagnosis; automotive industry; circuit testing; diagnosability; discrete event systems; offline diagnostics; online diagnostics; Actuators; Application software; Automobiles; Automotive engineering; Circuit testing; Control systems; Discrete event systems; Engines; Observability; Temperature control;
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI, USA
Print_ISBN :
0-7803-1760-2
DOI :
10.1109/MWSCAS.1993.343039