• DocumentCode
    2262828
  • Title

    The effect of temporal pulse shaping in ultrafast laser ablation of dielectrics

  • Author

    Stoian, R. ; Boyle, M. ; Thoss, A. ; Rosenfeld, A. ; Korn, G. ; Hertel, I.V.

  • Author_Institution
    Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin, Germany
  • fYear
    2002
  • fDate
    24-24 May 2002
  • Firstpage
    126
  • Abstract
    Summary from only given. Femtosecond laser ablation of dielectrics, especially of brittle materials, often results in specific collateral damage in the form of fracture and exfoliation, as a consequence of the mechanical stress induced in the material. Fast electronic relaxation in solids with strong electron-phonon coupling establishes a guideline for using temporally-shaped pulses to exploit dynamical processes and optimize structuring with respect to the reduction of the residual damage. First effects of a modulated excitation were extracted by studying laser-induced optical damage with temporally tailored pulses. Two extreme cases were considered; /spl alpha/-SiO/sub 2/ with 100 fs electron trapping in self-induced deformations and Al/sub 2/O/sub 3/ where electrons remain quasi-free for tens of ps.
  • Keywords
    deformation; electron-phonon interactions; high-speed optical techniques; laser ablation; /spl alpha/-SiO/sub 2/; Al/sub 2/O/sub 3/; SiO/sub 2/; brittle materials; collateral damage; dielectrics; femtosecond laser ablation; laser-induced optical damage; modulated excitation; residual damage; self-induced deformations; solids; strong electron-phonon coupling; temporally tailored pulses; temporally-shaped pulses; Dielectric materials; Electrons; Laser ablation; Optical materials; Optical pulses; Pulse modulation; Pulse shaping methods; Stress; Ultrafast electronics; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    1-55752-706-7
  • Type

    conf

  • DOI
    10.1109/CLEO.2002.1033514
  • Filename
    1033514