• DocumentCode
    2263072
  • Title

    Development of fast test platform for microsatellite

  • Author

    Yu, Peng ; Liu Datong ; Peng Xiyuan ; Yunfeng, Shao

  • Author_Institution
    Harbin Inst. of Technol., Harbin, China
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    Microsatellite is a kind of platform in space for various scientific researches. So, during its design, simulation and test process, the status and signals should be monitored and analyzed are complicated. According to those kinds of practical requirement, an open test platform suitable for fast test aimed in different research purpose should be considered. Thus, a brand-new solution based on SOPC (system on programmable chip) technology and synthetic instruments is presented in this paper. It adopts a distributed parallel test architecture with a standard high speed serial bus LVDS (low voltage differential signal) as the data communication and system control interface. This test platform has an open framework, a strong expansibility and a real-time processing ability for microsatellites test. It has been successfully applied and implements 200 ms periodical real-time monitoring and testing in a microsatellite test and simulation system.
  • Keywords
    artificial satellites; data communication; system-on-chip; testing; data communication; distributed parallel test architecture; fast test platform; high speed serial bus LVDS; low voltage differential signal; microsatellite; microsatellite monitoring; real-time processing; simulation system; synthetic instruments; system control interface; system on programmable chip technology; test process; Analytical models; Communication standards; Data communication; Instruments; Low voltage; Monitoring; Signal analysis; Signal design; Signal processing; System testing; distributed system; fast test; microsatellites test; parallel test; synthetic instruments;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314040
  • Filename
    5314040