• DocumentCode
    2263210
  • Title

    A capacitor-free CMOS low-dropout voltage regulator

  • Author

    Chen, Chia-Min ; Hung, Chung-Chih

  • Author_Institution
    Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    2525
  • Lastpage
    2528
  • Abstract
    This paper presents novel frequency compensation techniques for low-dropout (LDO) voltage regulator. An enhanced active feedback frequency compensation is employed to improve its frequency response. This LDO can provide high stability for loading current range up to 100 mA without loading capacitors. Moreover, the total compensation capacitors only require 7 pF for this technique. This allows us to integrate the compensation capacitors within the LDO chip easily. The proposed LDO regulator was designed using TSMC 0.35-mum CMOS technology. With an active area of 0.14 mm2, the quiescent current is only 40 muA. The input voltage is ranged from 1.73 V to 5 V for loading current of 100 mA and the output voltage of 1.5 V. The main advantage of this approach is that the LDO circuit can be stable when we connect external load capacitors with ultra low ESR, or even when we eliminate the load capacitors.
  • Keywords
    CMOS integrated circuits; compensation; frequency response; low-power electronics; voltage regulators; CMOS technology; LDO chip; capacitance 7 pF; capacitor-free CMOS low-dropout voltage regulator; current 100 mA; current 40 muA; frequency compensation techniques; frequency response; low-dropout voltage regulator; size 0.35 mum; voltage 1.5 V; voltage 1.73 V to 5 V; CMOS technology; Capacitors; Feedback; Frequency locked loops; Frequency response; Integrated circuit noise; Low voltage; Paramagnetic resonance; Regulators; Stability; Low dropout (LDO) voltage regulator; frequency compensation; line regulation; load regulation; loop stability; transient response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5118315
  • Filename
    5118315