DocumentCode
2263237
Title
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?
Author
Anghel, Lorena ; Nicolaidis, Michael ; Buard, Nadine
Author_Institution
TIMA
fYear
2006
fDate
10-12 July 2006
Firstpage
85
Lastpage
85
Abstract
This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.
Keywords
Circuit simulation; Circuit testing; Circuit topology; Collaborative work; Pulse generation; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Print_ISBN
0-7695-2620-9
Type
conf
DOI
10.1109/IOLTS.2006.40
Filename
1655524
Link To Document