• DocumentCode
    2263308
  • Title

    One-shot scanning using De Bruijn spaced grids

  • Author

    Ulusoy, Ali Osman ; Calakli, Fatih ; Taubin, Gabriel

  • Author_Institution
    Div. of Eng., Brown Univ., Providence, RI, USA
  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    1786
  • Lastpage
    1792
  • Abstract
    In this paper we present a new ¿one-shot¿ method to reconstruct the shape of dynamic 3D objects and scenes based on active illumination. In common with other related prior-art methods, a static grid pattern is projected onto the scene, a video sequence of the illuminated scene is captured, a shape estimate is produced independently for each video frame, and the one-shot property is realized at the expense of space resolution. The main challenge in grid-based one-shot methods is to engineer the pattern and algorithms so that the correspondence between pattern grid points and their images can be established very fast and without uncertainty. We present an efficient one-shot method which exploits simple geometric constraints to solve the correspondence problem. We also introduce De Bruijn spaced grids, a novel grid pattern, and show with strong empirical data that the resulting scheme is much more robust compared to those based on uniform spaced grids.
  • Keywords
    geometry; image reconstruction; image resolution; image sequences; shape recognition; video signal processing; 3D scene; De Bruijn spaced grids; active illumination; dynamic 3D object shape reconstruction; geometric constraint; illuminated scene; one-shot property; one-shot scanning; pattern grid point; space resolution; static grid pattern; video frame; video sequence; Cameras; Colored noise; Computer vision; Conferences; Image processing; Image reconstruction; Layout; Lighting; Robustness; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457499
  • Filename
    5457499