DocumentCode :
2263407
Title :
Evaluating one-hot encoding finite state machines for SEU reliability in SRAM-based FPGAs
Author :
Cassel, Maico ; Lima, Fausto
Author_Institution :
Inst. de Informatica, UFRGS, Porto Alegre
fYear :
0
fDate :
0-0 0
Abstract :
This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding styles have a significant influence on the dependability of the machine in presence of bit-flips, known as single event upsets (SEUs). Although the one-hot encoding style presents the best trade-off in terms of reliability, modern synthesis tools tend to optimize crucial characteristic of the one-hot style. Consequently, techniques must be applied in the hardware description language to ensure reliability of protected one-hot FSM. Results present in this paper show that fault-tolerant techniques can be easily optimized by the tools reducing the robustness of the final design. Solutions in the RTL level are proposed to ensure reliability
Keywords :
SRAM chips; circuit reliability; encoding; fault tolerance; field programmable gate arrays; finite state machines; FPGA; SEU reliability; SRAM; duplication with self-checking; fault tolerant techniques; finite state machines; one hot encoding; single event upsets; triple modular redundancy; Automata; Design optimization; Encoding; Fault tolerance; Field programmable gate arrays; Hardware design languages; Protection; Redundancy; Robustness; Single event upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Conference_Location :
Lake Como
Print_ISBN :
0-7695-2620-9
Type :
conf
DOI :
10.1109/IOLTS.2006.32
Filename :
1655533
Link To Document :
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