DocumentCode :
2263462
Title :
Implementing serial bus interfaces with general purpose digital instrumentation
Author :
Johnson, Dale
Author_Institution :
Geotest- Marvin Test Syst., Inc., Irvine, CA, USA
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
125
Lastpage :
129
Abstract :
The use of generic digital test instruments for emulating common serial bus protocols can provide benefits over dedicated bus test products, and often presents a trade-off between functionality, flexibility and cost. For example, a dedicated test instrument solution can offer more extensive test capabilities such as protocol support for controlling and analyzing traffic between a bus controller and a device under test. However, a more general-purpose solution that utilizes a digital test instrument can offer the flexibility to adapt to non-standard line rates and timing as well as supporting other digital test needs. Ultimately, the goal is to identify those instances where the clever or novel application of a general-purpose digital test tool is appropriate and provides tangible benefits. This paper presents an overview of how a general-purpose digital I/O instrument can used to support three widely used serial bus interfaces. By using a general-purpose digital I/O solution, users can potentially realize a lower cost test solution, a more compact test system footprint, multi-site test capability, a common user control interface and expandability for future requirements.
Keywords :
automatic test equipment; digital instrumentation; field buses; protocols; common user control interface; compact test system footprint; digital test instruments; general purpose digital instrumentation; general-purpose digital I/O instrument; general-purpose digital test tool; multisite test capability; serial bus interfaces; serial bus protocols; Circuit testing; Clocks; Cost function; Instruments; Logic testing; Master-slave; Protocols; Registers; System testing; Timing; I2C; JTAG; SPI; digital I/O instrument; serial bus interface;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314057
Filename :
5314057
Link To Document :
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