• DocumentCode
    2263462
  • Title

    Implementing serial bus interfaces with general purpose digital instrumentation

  • Author

    Johnson, Dale

  • Author_Institution
    Geotest- Marvin Test Syst., Inc., Irvine, CA, USA
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    125
  • Lastpage
    129
  • Abstract
    The use of generic digital test instruments for emulating common serial bus protocols can provide benefits over dedicated bus test products, and often presents a trade-off between functionality, flexibility and cost. For example, a dedicated test instrument solution can offer more extensive test capabilities such as protocol support for controlling and analyzing traffic between a bus controller and a device under test. However, a more general-purpose solution that utilizes a digital test instrument can offer the flexibility to adapt to non-standard line rates and timing as well as supporting other digital test needs. Ultimately, the goal is to identify those instances where the clever or novel application of a general-purpose digital test tool is appropriate and provides tangible benefits. This paper presents an overview of how a general-purpose digital I/O instrument can used to support three widely used serial bus interfaces. By using a general-purpose digital I/O solution, users can potentially realize a lower cost test solution, a more compact test system footprint, multi-site test capability, a common user control interface and expandability for future requirements.
  • Keywords
    automatic test equipment; digital instrumentation; field buses; protocols; common user control interface; compact test system footprint; digital test instruments; general purpose digital instrumentation; general-purpose digital I/O instrument; general-purpose digital test tool; multisite test capability; serial bus interfaces; serial bus protocols; Circuit testing; Clocks; Cost function; Instruments; Logic testing; Master-slave; Protocols; Registers; System testing; Timing; I2C; JTAG; SPI; digital I/O instrument; serial bus interface;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314057
  • Filename
    5314057