DocumentCode
2263474
Title
Consolidating test resources for avionics production test - requirements and applications
Author
Sonnenberg, Wolf ; Sharpio, Alex ; Dewey, Michael
Author_Institution
Teledyne Controls, El Segundo, CA, USA
fYear
2009
fDate
14-17 Sept. 2009
Firstpage
389
Lastpage
392
Abstract
The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. Historically, the development and deployment of production test systems for avionics products such as aircraft data acquisition and recording systems, navigation and communication products, and aircraft network systems have been addressed on a product specific basis - resulting in a variety of test platforms and solutions with little test system commonality and technology. Additionally, this lack of test system commonality and the requirement to maintain legacy products with long product life cycles results in increased maintenance and logistics costs for manufacturing and support test. Consequently, the adoption of a common test platform can offer producers of avionics products lower test costs, improved test resource utilization, and the flexibility to support both new and legacy products. This paper reviews the requirements and the implementation of a common test platform and environment that offers a high level of efficiency, supports the implementation of routine test processes, offers reusability, and allows the consolidation of test resources to facilitate the collection of reliability data and test results.
Keywords
military aircraft; military avionics; product life cycle management; testing; avionics product manufacturing; avionics production test; military aircraft; product life cycles; production test systems; Aerospace electronics; Aircraft manufacture; Aircraft navigation; Costs; Data acquisition; Life testing; Manufacturing; Military aircraft; Production systems; System testing; avionics test; functional test; production test;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2009 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4244-4980-4
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2009.5314058
Filename
5314058
Link To Document