Title :
Identifying edge chirality of graphene using polarization resolved μ-Raman spectroscopy
Author :
Begliarbekov, Milan ; Sul, Onejae ; Kalliakos, Sokratis ; Yang, Eui-Hyeok ; Strauf, Stefan
Author_Institution :
Dept. of Phys. & Eng. Phys., Stevens Inst. of Technol., Hoboken, NJ, USA
Abstract :
Development of optoelectronic devices based on the bandgap of nanosctructured graphene requires knowledge of edge chirality. We show that polarization resolved Raman spectroscopy can be used to determine the fractional edge composition of graphene.
Keywords :
Raman spectra; chirality; energy gap; graphene; nanostructured materials; C; bandgap; edge chirality; fractional edge composition; graphene; nanostructured graphene; optoelectronic devices; polarization resolved μ-Raman Spectroscopy; Contamination; Image edge detection; Indium tin oxide; Phonons; Raman scattering; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
