Test diagram generation: A practical application of the ATML standards

The IEEE Automatic Test Markup Language (ATML) family of standards allows Automatic Test System (ATS) and test information to be exchanged in a common format adhering to the Extensible Markup Language (XML) standard. Now that the standards have been published, through the IEEE SCC20, the next key step is the incorporation of these standards on actual ATS programs. The DoD ATS Framework Working Group (FWG) is participating in the phase II ATML interoperability demonstration effort to provide practical applications of these standards to promote their use on current and future programs. This paper examines one aspect of the ATML demonstration which is the use of the ATML standards in the generation of test diagrams to support Test Program Sets (TPSs).