DocumentCode :
2263635
Title :
Temporal reflectance changes in vegetables
Author :
Dissing, Bjørn S. ; Clemmesen, Line H. ; Løje, Hanne ; Ersbøll, Bjarne K. ; Adler-Nissen, Jens
Author_Institution :
Dept. of Inf. & Math. Modelling, Tech. Univ. of Denmark, Lyngby, Denmark
fYear :
2009
fDate :
Sept. 27 2009-Oct. 4 2009
Firstpage :
1917
Lastpage :
1922
Abstract :
Quality control in the food industry is often performed by measuring various chemical compounds of the food involved. We propose an imaging concept for acquiring high quality multispectral images to evaluate changes of carrots and celeriac over a period of 14 days. Properties originating in the surface chemistry of vegetables may be captured in an integrating sphere illumination which enables the creation of detailed surface chemistry maps with a good combination of spectral and spatial resolutions. Prior to multispectral image recording, the vegetables were prefried and frozen at -30°C for four months. During the 14 days of image recording, the vegetables were kept at +5°C in refrigeration. In this period, surface changes and thereby reflectance properties were very subtle. To describe this small variation we employed advanced statistical techniques to search a large featurespace of variables extracted from the chemistry maps. The resulting components showed a change in both the carrot and celeriac samples. We were able to deduct from the resulting components that oxidation caused the changes over time.
Keywords :
agricultural products; food processing industry; image segmentation; production engineering computing; quality control; statistical analysis; chemistry maps; food industry; multispectral image recording; quality control; sphere illumination; statistical techniques; temporal reflectance; vegetables surface chemistry; Chemical compounds; Chemistry; Food industry; Lighting; Multispectral imaging; Performance evaluation; Quality control; Reflectivity; Refrigeration; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-4442-7
Electronic_ISBN :
978-1-4244-4441-0
Type :
conf
DOI :
10.1109/ICCVW.2009.5457516
Filename :
5457516
Link To Document :
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