• DocumentCode
    2263673
  • Title

    Broadband electrical permittivity of gold for plasmonics and nano-optics applications

  • Author

    Boreman, Glenn D. ; Johnson, Timothy ; Jones, Andrew C. ; Oh, Sang-Hyun ; Olmon, Robert L. ; Raschke, Markus B. ; Shelton, David ; Slovick, Brian

  • Author_Institution
    Center for Res. & Educ. in Opt. & Lasers (CREOL), Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We measure the electrical permittivity of different bulk and film gold samples by spectroscopic ellipsometry from 200 nm to 20 μm, resolving inconsistencies on plasmon resonances, lifetime, and SPP propagation associated with imprecise current literature values.
  • Keywords
    ellipsometry; gold; nanophotonics; permittivity; permittivity measurement; plasmonics; surface plasmon resonance; SPP propagation; broadband electrical permittivity; gold; nanooptics applications; plasmon resonances; plasmonics; spectroscopic ellipsometry; Gold; Optical surface waves; Permittivity; Permittivity measurement; Plasmons; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5951619