Title :
Checker no-harm alarm robustness
Author :
Rossi, Daniele ; Omana, Martin ; Metra, Cecilia ; Pagni, Andrea
Author_Institution :
D.E.I.S., Bologna Univ.
Abstract :
In this paper we evaluate the probability that a transient fault (TF), multiple or single, affecting a checker of a self-checking circuit, gives rise to an unnecessary error indication (no-harm alarm). A new property (no-harm alarm robustness) has been defined that, in case of a fault affecting a self-checking circuit (SCC), guarantees that we can determine whether the fault is affecting the functional block, or the checker itself, and whether such a fault is a transient or a permanent fault. Finally, we propose a possible solution implementing the defined property. Its behavior has been verified by means of HSpice simulations, and we evaluate its cost in terms of area overhead and introduced delay
Keywords :
SPICE; built-in self test; error statistics; fault simulation; integrated circuit testing; HSpice simulations; SCC; TF; area overhead; checker; fault effect; functional block; no-harm alarm robustness; permanent fault; probability evaluation; self-checking circuit; transient fault; unnecessary error indication; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Costs; Delay; Error correction; Microelectronics; Robustness; Sea level;
Conference_Titel :
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Conference_Location :
Lake Como
Print_ISBN :
0-7695-2620-9
DOI :
10.1109/IOLTS.2006.16