• DocumentCode
    2263965
  • Title

    Checker no-harm alarm robustness

  • Author

    Rossi, Daniele ; Omana, Martin ; Metra, Cecilia ; Pagni, Andrea

  • Author_Institution
    D.E.I.S., Bologna Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Lastpage
    280
  • Abstract
    In this paper we evaluate the probability that a transient fault (TF), multiple or single, affecting a checker of a self-checking circuit, gives rise to an unnecessary error indication (no-harm alarm). A new property (no-harm alarm robustness) has been defined that, in case of a fault affecting a self-checking circuit (SCC), guarantees that we can determine whether the fault is affecting the functional block, or the checker itself, and whether such a fault is a transient or a permanent fault. Finally, we propose a possible solution implementing the defined property. Its behavior has been verified by means of HSpice simulations, and we evaluate its cost in terms of area overhead and introduced delay
  • Keywords
    SPICE; built-in self test; error statistics; fault simulation; integrated circuit testing; HSpice simulations; SCC; TF; area overhead; checker; fault effect; functional block; no-harm alarm robustness; permanent fault; probability evaluation; self-checking circuit; transient fault; unnecessary error indication; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Costs; Delay; Error correction; Microelectronics; Robustness; Sea level;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
  • Conference_Location
    Lake Como
  • Print_ISBN
    0-7695-2620-9
  • Type

    conf

  • DOI
    10.1109/IOLTS.2006.16
  • Filename
    1655561