Re-host factors and a method to maintain the integrity of a test

Author

Kirkland, Larry

Author_Institution

WesTest Eng., Farmington, UT, USA

fYear

2009

fDate

14-17 Sept. 2009

Firstpage

24

Lastpage

28

Abstract

Re-hosting test program sets (TPS) is a diverse science. Methods of re-host are determined by many multifaceted factors. Some of these factors are: circuit complexity, customer requirements, documentation, optimal circuit coverage, schematics and data availability, existence of and obtainable test specs, legacy TPS history (no-fault-found and could-not duplicate problems or a high quality reliable TPS), quality of unit under test (UUT) data, technology of the TPS (digital, analog, hybrid, etc.), legacy ATEs, software (SW) development environment, SW tools and translators, interface test adapters (ITA), contractual requirements; mating connectors, test connectors and fixtures and usability and accessibility of existing legacy TPS code. This paper will cover various TPS re-hosting philosophies. Also, the paper will discuss the details of using the soft front panel method to duplicate a non-simulated digital legacy TPS.

Keywords

circuit testing; electronic engineering computing; TPS re-hosting philosophies; digital legacy TPS; re-host factors; soft front panel method; test program sets; Availability; Circuit testing; Complexity theory; Connectors; Documentation; Fixtures; History; Software quality; Software testing; Software tools;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2009 IEEE

Conference_Location

Anaheim, CA

ISSN

1088-7725

Print_ISBN

978-1-4244-4980-4

Electronic_ISBN

1088-7725

Type

conf

DOI

10.1109/AUTEST.2009.5314098

Filename

5314098