Title :
An 8-bit 0.35-V 5.04-fJ/Conversion-Step SAR ADC With Background Self-Calibration of Comparator Offset
Author :
Rabuske, Taimur ; Rabuske, Fabio ; Fernandes, Jorge ; Rodrigues, Cesar
Author_Institution :
Inst. de Eng. de Sist. e Comput.-Investig. e Desenvolvimento, Univ. de Lisboa, Lisbon, Portugal
Abstract :
This paper reports a successive approximation register (SAR) analog-to-digital converter (ADC) based on the charge-sharing principle, which is known to be very energy efficient, but susceptible to the comparator offset. The ADC uses a new background calibration technique to cancel out the comparator mismatch and improve ADC linearity. Operation under low voltages is obtained through the use of voltage-boosted switches in the track-and-hold and the digitalto-analog converter. The techniques are demonstrated on a low-voltage low-power SAR ADC that operates from a minimum supply voltage of 350 up to 600 mV, suitable for circuits supplied by power harvesters. The prototype fabricated in a 130-nm CMOS process employs only regular-VTH transistors. It is able to convert at 3 MSps when supplied by 600 mV and at 200 kSps when supplied by 350 mV. At 350 mV, the measured effective-number-of-bits is 6.4, leading to a figure-of-merit of 5.04 fJ/conversion-step.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; comparators (circuits); digital-analogue conversion; flip-flops; sample and hold circuits; ADC linearity; CMOS process; background self-calibration technique; charge-sharing principle; comparator mismatch cancellation; comparator offset; complementary metal oxide semiconductor; conversion-step SAR ADC; digitalto-analog converter; effective-number-of-bit; figure-of-merit; power harvester; size 130 nm; successive approximation register analog-to-digital converter; track-and-hold circuit; voltage 0.35 V; voltage 350 mV to 600 mV; voltage-boosted switch; word length 8 bit; Approximation methods; Calibration; Capacitors; Logic gates; Noise; Topology; Transistors; Analog-to-digital converter (ADC); charge sharing (CS); comparator calibration; low voltage; successive approximation register (SAR);
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2337236