• DocumentCode
    2264453
  • Title

    A Methodology of Knowledge Management Based on Ontology in Collaborative Design

  • Author

    Hou, Junming ; Su, Chong ; Su, Yingying ; Wan, Wanshan

  • Author_Institution
    Sch. of Mech. Eng. & Autom., Northeastern Univ., Shenyang
  • Volume
    2
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    409
  • Lastpage
    413
  • Abstract
    To have shorter development times and reduced costs, enterprise need a method towards global market for product design. Collaborative design is a method to meet the requirement. In collaborative design, knowledge is exchanged and accessed efficiently through the teams. How to reuse the knowledge of experts is a problem. A methodology for knowledge management in collaborative design is proposed. Firstly, the concepts of the collaborative design and knowledge management are introduced. Secondly, the knowledge expression based on ontology is introduced. UML model for knowledge capture is established to find suitable knowledge. The knowledge capture formalization is established for the knowledge reuse. At last, the integration framework of knowledge requirement and knowledge reuse is constructed with a component, which includes the knowledge capture, knowledge requirement and knowledge reuse. The knowledge can be reused for collaborative design.
  • Keywords
    CAD; Unified Modeling Language; cost reduction; groupware; knowledge management; ontologies (artificial intelligence); product design; UML model; collaborative design; cost reduction; global market; integration framework; knowledge management; ontology; product design; Assembly systems; Collaboration; Collaborative work; Computer aided manufacturing; Design automation; Design methodology; Globalization; Knowledge management; Ontologies; Process design; Collaborative Design; Knowledge Management; Ontology; UML model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3497-8
  • Type

    conf

  • DOI
    10.1109/IITA.2008.503
  • Filename
    4739796