DocumentCode :
226452
Title :
Two lattice metrics dendritic computing for pattern recognition
Author :
Ritter, Gerhard X. ; Urcid, Gonzalo ; Valdiviezo-N, Juan-Carlos
Author_Institution :
CISE Dept., Univ. of Florida, Gainesville, FL, USA
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
45
Lastpage :
52
Abstract :
An artificial neural network model based on dendritic computation using two lattice metrics is introduced in this paper. A description of the mathematical framework of the proposed model is provided and its corresponding learning algorithm is presented in mathematical pseudocode. Computational experiments are given to demonstrate the effectiveness and performance of the learning algorithm as well as its application to some illustrative pattern recognition problems.
Keywords :
learning (artificial intelligence); neural nets; pattern recognition; artificial neural network model; computational experiments; dendritic computing; lattice metrics; learning algorithm; mathematical pseudocode; pattern recognition problems; Computational modeling; Lattices; Mathematical model; Measurement; Neurons; Training; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fuzzy Systems (FUZZ-IEEE), 2014 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-2073-0
Type :
conf
DOI :
10.1109/FUZZ-IEEE.2014.6891551
Filename :
6891551
Link To Document :
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