DocumentCode :
2264652
Title :
3D integration technologies for MEMS/IC systems
Author :
Ramm, Peter ; Klumpp, Armin ; Weber, Josef
Author_Institution :
Munich Div., Fraunhofer Inst. for Reliability & Microintegration, Munich, Germany
fYear :
2009
fDate :
12-14 Oct. 2009
Firstpage :
138
Lastpage :
141
Abstract :
3D integration is a key solution to the predicted performance problems of future ICs as well as it offers extreme miniaturization and cost-effective fabrication of so-called more than Moore products as e.g. MEMS/IC systems. Through silicon via (TSV) technologies enable high interconnect performance at relatively high fabrication cost compared to 3D packaging. In general it is not only one 3D integration technology suitable for the fabrication of the large variety of 3D integrated systems. Moreover, even one single product may need several different technologies for a cost-effective fabrication. Wireless sensor systems (e.g. e-CUBESreg) an excellent example for the need of a suitable mixture. Consisting of MEMS, ICs, memories, antennas and power modules they can only be fabricated in a cost-efficient way by application of specific optimized 3D technologies for the integration of the different sub-modules. The technology choice for an e-CUBES demonstrator is described.
Keywords :
integrated circuit interconnections; microfabrication; 3D integration technologies; 3D packaging; MEMS-IC systems; Moore products; antennas; cost-effective fabrication; e-CUBES demonstrator; power modules; through silicon via technologies; wireless sensor systems; Micromechanical devices; 3D Integration; 3D-IC; ICV-SLID; MEMS; More than Moore; TPMS; TSV technology; Through Silicon Via; e-CUBES; heterogeneous systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
Conference_Location :
Capri
ISSN :
1088-9299
Print_ISBN :
978-1-4244-4894-4
Electronic_ISBN :
1088-9299
Type :
conf
DOI :
10.1109/BIPOL.2009.5314117
Filename :
5314117
Link To Document :
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