Title :
Near-field mapping of infrared optical antennas
Author :
Olmon, Robert L. ; Jones, Andrew ; Krenz, Peter ; Boreman, Glenn ; Raschke, Markus B.
Abstract :
The near-field distribution of linear optical antennas is measured with phase-contrast scattering-type near-field microscopy (s-SNOM). A distinct scaling behavior with antenna length is observed for different structures with and without gap.
Keywords :
antenna radiation patterns; antenna testing; near-field scanning optical microscopy; antenna length; infrared linear optical antennas; near-field mapping; near-field microscopy; phase-contrast scattering-type SNOM; s-SNOM measurement; Antenna measurements; Atom optics; Electromagnetic scattering; Optical design; Optical microscopy; Optical polarization; Optical scattering; Optical sensors; Radio frequency; Spatial resolution; (180.4243) Near-field microscopy; (260.3910) Metal optics;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
