• DocumentCode
    2264774
  • Title

    Batched and cascaded run rate validation in a multi-module toolset

  • Author

    Daly, K.

  • Author_Institution
    Leixlip Co., Intel Ireland Ltd., Kildare, Ireland
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    111
  • Lastpage
    114
  • Abstract
    As the run rate of a multi-module toolset can depend on many dynamic factors such as the product/layer mix, cascade level, and batch size, it is very difficult to predict the actual run rates that will be achieved in practice. Thus, validation of these is critical to accurate capacity planning. This paper discusses a robust and straightforward process, and presentation format, that delivers an unambiguous statement of the run rate performance for multi-module toolsets. At Intel Ireland, this process has significantly improved the accuracy of the tool capacity calculations and has reduced the validation time by over 90%.
  • Keywords
    capacity planning (manufacturing); integrated circuit manufacture; lithography; modules; production facilities; tools; batch size; batched run rate validation; capacity planning; cascade level; cascaded run rate validation; multimodule toolset; product/layer mix; robust processes; tool capacity calculations; Capacity planning; Costs; Data analysis; Lithography; Manufacturing; Mathematical model; Product design; Production facilities; Robustness; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2003 IEEE International Symposium on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7894-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2003.1243243
  • Filename
    1243243