DocumentCode
2264892
Title
Investigation of histogram method implementation for high resolution ADC testing
Author
Kochan, R. ; Kochan, O. ; Sapojnyk, G. ; Chyrka, M.
Author_Institution
Lviv Nat. Polytech. Univ., Lviv, Ukraine
Volume
1
fYear
2011
fDate
15-17 Sept. 2011
Firstpage
43
Lastpage
49
Abstract
There is done analysis of the expediency of histogram method implementation for investigation of integral nonlinearity of high resolution ADC.
Keywords
analogue-digital conversion; circuit testing; high resolution ADC testing; histogram method implementation; integral nonlinearity; Additives; Analog-digital conversion; Calibration; Computational modeling; Harmonic analysis; Histograms; Testing; analog to digital converter; histogram method; integral nonlinearity;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on
Conference_Location
Prague
Print_ISBN
978-1-4577-1426-9
Type
conf
DOI
10.1109/IDAACS.2011.6072708
Filename
6072708
Link To Document