Title :
Investigation of histogram method implementation for high resolution ADC testing
Author :
Kochan, R. ; Kochan, O. ; Sapojnyk, G. ; Chyrka, M.
Author_Institution :
Lviv Nat. Polytech. Univ., Lviv, Ukraine
Abstract :
There is done analysis of the expediency of histogram method implementation for investigation of integral nonlinearity of high resolution ADC.
Keywords :
analogue-digital conversion; circuit testing; high resolution ADC testing; histogram method implementation; integral nonlinearity; Additives; Analog-digital conversion; Calibration; Computational modeling; Harmonic analysis; Histograms; Testing; analog to digital converter; histogram method; integral nonlinearity;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on
Conference_Location :
Prague
Print_ISBN :
978-1-4577-1426-9
DOI :
10.1109/IDAACS.2011.6072708
